The nature of high-temperature instability in fully depleted SOI IM n-MOSFETs.
| Autor: | Nazarov, A.N., Barchuk, I.P., Colinge, J.-P. |
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| Zdroj: | 1998 Fourth International High Temperature Electronics Conference HITEC (Cat No98EX145); 1998, p226-229, 4p |
| Databáze: | Complementary Index |
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