Analog VLSI parameter fault diagnosis via neural network.
| Autor: | Gan Junren, Wang Bijuan, Yao Linshen |
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| Zdroj: | 1998 5th International Conference on Solid-State & Integrated Circuit Technology Proceedings (Cat No98EX105); 1998, p381-384, 4p |
| Databáze: | Complementary Index |
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