Outgassing of hydrogen in an enclosed cavity and ramifications on the reliability of GaAs devices.
Autor: | Reisinger, A.R., Adams, S.B., Immorlica, A.A. |
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Zdroj: | 1997 GaAs Reliability Workshop Proceedings; 1997, p77-95, 19p |
Databáze: | Complementary Index |
Externí odkaz: |