Analysis of edge effects in the mesa isolated nMOS SOI.
| Autor: | Tseng, Y.C., Collett, J., Vu, T.O., Cable, J.S., Woo, J.C.S. |
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| Zdroj: | 1996 IEEE International SOI Conference Proceedings; 1996, p90-91, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Tseng, Y.C., Collett, J., Vu, T.O., Cable, J.S., Woo, J.C.S. |
|---|---|
| Zdroj: | 1996 IEEE International SOI Conference Proceedings; 1996, p90-91, 2p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|