Electrically measuring the peak channel temperature of power GaAs MESFET.
| Autor: | Wang, M.Z., Lu, C.Z., Cheng, Z.H., Wang, Z., Feng, S.W., Ding, G.Y., Li, X.X., Gao, G.B. |
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| Zdroj: | 1993 Proceedings Ninth Annual IEEE Semiconductor Thermal Measurement & Management Symposium; 1993, p112-116, 5p |
| Databáze: | Complementary Index |
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