A systematic approach to defining the structure of a test suite for the NELSIS IC design system.
| Autor: | van Dijk, G.J., Sim, M.N., Kist, P.M., Schot, C.A. |
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| Zdroj: | 1993 European Conference on Design Automation with the European Event in ASIC Design; 1993, p334-339, 6p |
| Databáze: | Complementary Index |
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