Fast measurement of the peak junction temperature of power transistors using electrical method.
| Autor: | Lu, C.Z., Wang, M.Z., Gui, X., Gao, G.B., Yi, B.J. |
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| Zdroj: | 1991 Proceedings Seventh IEEE Semiconductor Thermal Measurement & Management Symposium; 1991, p39-43, 5p |
| Databáze: | Complementary Index |
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