Application of Bayesian networks to predict SMART power semiconductor lifetime.
| Autor: | Plankensteiner, Kathrin, Bluder, Olivia, Pilz, Jurgen |
|---|---|
| Zdroj: | Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics & Electronics (PRIME); 2013, p281-284, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|