Research on accelerated electrical stress test for electronic product.
| Autor: | Zhang, Guo-Long, Cai, Jin-Yan, Pan, Gang, Li, Wei, Ren, Bo-Feng |
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| Zdroj: | 2013 International Conference on Quality, Reliability, Risk, Maintenance & Safety Engineering (QR2MSE); 2013, p1106-1109, 4p |
| Databáze: | Complementary Index |
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