Modeling and optimization of the chip level program disturbance of 3D NAND Flash memory.

Autor: Yoo, HyunSeung, Choi, EunSeok, Oh, JungSeok, Park, KyoungJin, Jung, SungWook, Kim, SeHoon, Shim, KeonSoo, Joo, HanSoo, Jeon, KwangSun, Seo, MoonSik, Jang, YoonSoo, Lee, SangBum, Lee, JuYeab, Oh, SangHyun, Cho, GyuSeog, Park, SungKye, Lee, SeokKiu, Hong, SungJoo
Zdroj: 2013 5th IEEE International Memory Workshop; 2013, p147-150, 4p
Databáze: Complementary Index