Analysis of Strain Depth Variations in an In0.19Ga0.81N Layer by Raman Spectroscopy.
| Autor: | Correia, M.R., Pereira, S., Frandon, J., Renucci, M.A., Alves, E., Sequeira, A.D., Franco, N. |
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| Zdroj: | Physica Status Solidi (C); 2003, Vol. 0 Issue 1, p563-567, 5p |
| Databáze: | Complementary Index |
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