Nanoscale Detection of Ionizing Radiation Damage to DNA by Atomic Force Microscopy.

Autor: Ke, Changhong, Jiang, Yong, Mieczkowski, Piotr A., Muramoto, Garrett G., Chute, John P., Marszalek, Piotr E.
Zdroj: Small; 2008, Vol. 4 Issue 2, p288-294, 7p
Databáze: Complementary Index
Externí odkaz: