Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?

Autor: Mottu, N., Vayer, M., Benoit, R., Erre, R.
Zdroj: Surface & Interface Analysis: SIA; 2002, Vol. 34 Issue 1, p276-279, 4p
Databáze: Complementary Index
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