Combined application of ion beam slope cutting and SEM/EDX for investigation of the surface layer system on tungsten microwires after tribological treatment.

Autor: Hauffe, W., Pannicke, S., Däbritz, S., Schade, P.
Zdroj: Surface & Interface Analysis: SIA; 2002, Vol. 34 Issue 1, p786-789, 4p
Databáze: Complementary Index
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