Model for Analysis of XPS Electron Take-off Angle Experiments in Layer-structured Samples: Determination of Attenuation Lengths in a Well-characterized Langmuir-Blodgett Film.

Autor: Suzuki, Noboru, Iimura, Ken-ichi, Satoh, Shin, Saito, Yoshinari, Kato, Teiji, Tanaka, Akihiro
Zdroj: Surface & Interface Analysis: SIA; 1997, Vol. 25 Issue 9, p650-659, 10p
Databáze: Complementary Index
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