Gas Sensing Characteristics of Ultrathin TiO2− x Films Investigated with XPS, TPD and In Situ Resistance Measurements.

Autor: Walton, R. M., Gland, J. L., Schwank, J. W.
Zdroj: Surface & Interface Analysis: SIA; 1997, Vol. 25 Issue 2, p76-80, 5p
Databáze: Complementary Index
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