Formation of barium carbide during AES depth profiling of thin BaF2 films.
| Autor: | Kashin, G. N., Makhnjuk, V. I. |
|---|---|
| Zdroj: | Surface & Interface Analysis: SIA; 1994, Vol. 21 Issue 12, p870-873, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Kashin, G. N., Makhnjuk, V. I. |
|---|---|
| Zdroj: | Surface & Interface Analysis: SIA; 1994, Vol. 21 Issue 12, p870-873, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
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