Evaluation of AES depth profiles of thin-film systems by application of novel graphically interactive factor analysis software.

Autor:	Scheithauer, U., Hösler, W., Riedl, G.
Zdroj:	Surface & Interface Analysis: SIA; 1993, Vol. 20 Issue 6, p519-523, 5p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Plný text