A one-film-model ellipsometry program for the simultaneous calculation of protein film thickness and refractive index.

Autor: Krisdhasima, Viwat, McGuire, Joseph, Sproull, Robert
Zdroj: Surface & Interface Analysis: SIA; 1992, Vol. 18 Issue 6, p453-456, 4p
Databáze: Complementary Index
Externí odkaz: