Quantitative trace analysis by non-resonant laser post-ionization.

Autor: Hayashi, S., Hashiguchi, Y., Suzuki, K., Ohtsubo, T., McIntosh, B. J.
Zdroj: Surface & Interface Analysis: SIA; 1991, Vol. 17 Issue 11, p773-778, 6p
Databáze: Complementary Index
Externí odkaz: