Charge compensation and high-resolution TOFSIMS imaging of insulating materials.

Autor: Briggs, D., Hearn, M. J., Fletcher, I. W., Waugh, A. R., McIntosh, B. J.
Zdroj: Surface & Interface Analysis: SIA; 1990, Vol. 15 Issue 1, p62-65, 4p
Databáze: Complementary Index
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