Mean free path for inelastic scattering of 1.2 kev electrons in thin poly(methylmethacrylate) films.

Autor: Roberts, R. F., Allara, D. L., Pryde, C. A., Buchanan, D. N. E., Hobbins, N. D.
Zdroj: Surface & Interface Analysis: SIA; 1980, Vol. 2 Issue 1, p5-10, 6p
Databáze: Complementary Index