X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb.
| Autor: | Gorelik, S. S., Bublik, V. T., Khatsernov, M. A., Voronov, I. N., Makeev, H. I., Malvinova, I. S. |
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| Zdroj: | Kristall & Technik; 1972, Vol. 7 Issue 12, p1349-1357, 9p |
| Databáze: | Complementary Index |
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