| Autor: |
Shimizu, Katsumi, Uozaki, Yoshihito, Nozaki, Kimihiko, Uenaka, Mai, Terauchi, Hikaru, Takahashi, Isao |
| Předmět: |
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| Zdroj: |
Journal of the American Oil Chemists' Society (JAOCS); Oct2013, Vol. 90 Issue 10, p1439-1448, 10p |
| Abstrakt: |
X-ray reflectivity (XR) and scanning probe microscopy (SPM) were used to examine the structures, polymorphic transitions, and surface morphologies of triacylglycerol (TAG), 1,3-stearin-2-olein (SOS) and 1-palmitin-2-olein-3-stearin (POS) thin films supported on Si substrates. The structural parameters: thickness, electron density, and surface/interface roughnesses of TAG thin films were determined by the nonlinear least-squares regression of XR profiles to reveal their temperature dependences. In the lower temperature regimes, we observed Bragg peaks without significant interference fringe patterns in the XR profiles. SPM at room temperature displayed isolated islands on TAG thin films with surface undulations. Whereas in the higher temperature regimes in which the Bragg peaks disappeared, the interference fringe patterns became prominent. The analyses of the XR profiles indicated the structural change in thin films from three layers to single layer on Si substrates with increasing temperature. However, the temperatures at which the structural change occurred were obviously different between SOS and POS thin films. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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