Design for reliability of multi-layer thin film stretchable interconnects.

Autor: Hsu, Yung-Yu, Lucas, Kylie, Davis, Dan, Ghaffari, Rooz, Elolampi, Brian, Dalal, Mitul, Work, John, Lee, Stephen, Rafferty, Conor, Dowling, Kevin
Zdroj: 2013 IEEE 63rd Electronic Components & Technology Conference; 2013, p623-628, 6p
Databáze: Complementary Index