Drain stress influence on read disturb defectivity.
| Autor: | De Tomasi, M., Vaion, R. Enrici, Cola, L., Zabberoni, P., Mervic, A. |
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| Zdroj: | 2013 IEEE International Reliability Physics Symposium (IRPS); 2013, pMY.1-MY.1-MY.12.5, 0p |
| Databáze: | Complementary Index |
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