Phase noise and transient measurement methods for V-band applications.

Autor: Ou, Ya-Wen, Su, Sy-Haur, Chang, Yin-Cheng, Lin, Shuw-Guann, Cheng, Hsu-Chen, Juang, Ying-Zong, Chang, Da-Chiang, Chiou, Hwann-Kaeo
Zdroj: 2013 IEEE International Instrumentation & Measurement Technology Conference (I2MTC); 2013, p461-464, 4p
Databáze: Complementary Index