Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS.
| Autor: | McNeill, John, David, Christopher, Coln, Michael C. W., Chan, Ka Yan, Brenneman, Cody |
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| Zdroj: | 2013 IEEE International Instrumentation & Measurement Technology Conference (I2MTC); 2013, p310-313, 4p |
| Databáze: | Complementary Index |
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