Optical high frequency test structure and test bench definition for on wafer silicon integrated noise source characterization up to 110 GHz based on Germanium-on-Silicon photodiode.
| Autor: | Oeuvrard, S., Lampin, J.-F., Ducournau, G., Virot, L., Fedeli, J.M., Hartmann, J.M., Danneville, F., Morandini, Y., Gloria, D. |
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| Zdroj: | 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2013, p73-76, 4p |
| Databáze: | Complementary Index |
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