Study of the insertion loss of a differential pair of through holes for the 25-Gbps serial interconnect.
| Autor: | Shinkai, Go, Muraoka, Satoshi, Yagu, Masayoshi, Uematsu, Yutaka, Osaka, Hideki |
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| Zdroj: | 2012 2nd IEEE CPMT Symposium Japan; 2012, p1-4, 4p |
| Databáze: | Complementary Index |
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