Joint reliability study of solder capped metal pillar bump interconnections on an organic substrate.

Autor: Toriyama, Kazushige, Takeoka, Yasushi, Okamoto, Keishi, Noma, Hirokazu, Orii, Yasumitsu
Zdroj: 2012 2nd IEEE CPMT Symposium Japan; 2012, p1-4, 4p
Databáze: Complementary Index