Autor: |
Yin, You, Hosaka, Sumio, Ik Park, Woon, Sik Jung, Yeon, Jae Lee, Keon, Kuk You, Byoung, Liu, Yang, Yu, Qi |
Předmět: |
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Zdroj: |
Applied Physics Letters; 7/15/2013, Vol. 103 Issue 3, p033116-033116-5, 1p, 4 Graphs |
Abstrakt: |
In this work, a phase-change memory (PCM) with self-assembled nanostructures and an oxidized thin phase-change layer is proposed and intensively investigated for low writing reset current by finite element analysis. Current density is significantly enhanced in our nano-contact memory because of the existence of nanostructures and oxidized phase-change layer. The writing current of our proposed memory is about 1/10-3/10 that of conventional cell, which is in good agreement with our experimental results. The heat efficiency in the nano-contact PCM cell is greatly improved and its power consumption can be as low as about 1/10 that of the conventional cell. [ABSTRACT FROM AUTHOR] |
Databáze: |
Complementary Index |
Externí odkaz: |
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