Current density enhancement nano-contact phase-change memory for low writing current.

Autor: Yin, You, Hosaka, Sumio, Ik Park, Woon, Sik Jung, Yeon, Jae Lee, Keon, Kuk You, Byoung, Liu, Yang, Yu, Qi
Předmět:
Zdroj: Applied Physics Letters; 7/15/2013, Vol. 103 Issue 3, p033116-033116-5, 1p, 4 Graphs
Abstrakt: In this work, a phase-change memory (PCM) with self-assembled nanostructures and an oxidized thin phase-change layer is proposed and intensively investigated for low writing reset current by finite element analysis. Current density is significantly enhanced in our nano-contact memory because of the existence of nanostructures and oxidized phase-change layer. The writing current of our proposed memory is about 1/10-3/10 that of conventional cell, which is in good agreement with our experimental results. The heat efficiency in the nano-contact PCM cell is greatly improved and its power consumption can be as low as about 1/10 that of the conventional cell. [ABSTRACT FROM AUTHOR]
Databáze: Complementary Index