| Autor: |
Fink, D., Möckel, H. J., Melzer, H., Klett, R., Cardoso, J., Montiel, R., Vàzquez, H., Hosoi, F., Omichi, H., Wang, L., Chadderton, L. T. |
| Předmět: |
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| Zdroj: |
Applied Physics A: Materials Science & Processing; 1997, Vol. 64 Issue 1, p61, 8p |
| Abstrakt: |
Examinations were performed on GeV-ion irradiated plexiglas. The radiochemical reaction products are studied by FTIR and UV spectrometry as a function of their depth of origin, and some of the possible radiochemical reaction mechanisms are examined in detail. The radiochemistry of commercial plexiglas is found to differ somewhat from the one of pure PMMA. No hint for ion-induced buckminsterfullerene formation could be found. [ABSTRACT FROM AUTHOR] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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