Characteristics of MEMS scanners with different driving bias.
| Autor: | Tantipiriyakij, Parima, Sankatumvong, Porntipa, Sarapukdee, Pongsak, Rattanavarin, Santi, Jarujareet, Ungkarn, Khemthongcharoen, Numfon, Ruangphacha, Athisake, Il Woong Jung, Piyawattanametha, Wibool |
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| Zdroj: | 2012 IEEE International Conference on Electron Devices & Solid State Circuit (EDSSC); 2012, p1-2, 2p |
| Databáze: | Complementary Index |
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