Characterization of polarization sensitive, high efficiency dielectric gratings for formation flight interferometry.

Autor: Sun, Ke-Xun, Lu, Patrick, Byer, Robert L, Britten, Jerald A, Nguyen, Hoang T, Nissen, James D, Larson, Cindy C, Aasen, Michael D, Carlson, Thomas C, Hoaglan, Curly R
Zdroj: Journal of Physics: Conference Series; 2009, Vol. 154 Issue 1, p012031-012036, 6p
Databáze: Complementary Index