X-ray absorption and diffraction study of II–VI dilute oxide semiconductor alloy epilayers.
| Autor: | Boscherini, F, Malvestuto, M, Ciatto, G, D’Acapito, F, Bisognin, G, Salvador, D De, Berti, M, Felici, M, Polimeni, A, Nabetani, Y |
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| Zdroj: | Journal of Physics: Condensed Matter; 11/ 7/2007, Vol. 19 Issue 44, p446201-446212, 12p |
| Databáze: | Complementary Index |
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