Characterization of CdSxTe1-x thin films through thermoelectric power measurements.
| Autor: | J�come, C, Fl�rez, M, Gurevich, Y G, Giraldo, J, Gordillo, G |
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| Zdroj: | Journal of Physics D: Applied Physics; 6/21/2001, Vol. 34 Issue 12, p1862-1867, 6p |
| Databáze: | Complementary Index |
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