Determination of the chemical composition of distorted InGaN/GaN heterostructures from x-ray diffraction data.
| Autor: | Schuster, M, Gervais, P O, Jobst, B, Hösler, W, Averbeck, R, Riechert, H, Iberl, A, Stömmer, R |
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| Zdroj: | Journal of Physics D: Applied Physics; 5/21/1999, Vol. 32 Issue 10, pA56-A60, 5p |
| Databáze: | Complementary Index |
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