Progress towards site-specific dopant profiling in the scanning electron microscope.
| Autor: | Jepson, M A E, Inkson, B J, Beanland, R, Chee, A K W, Humphreys, C J, Rodenburg, C |
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| Zdroj: | Journal of Physics: Conference Series; 2010, Vol. 209 Issue 1, p012068-012071, 4p |
| Databáze: | Complementary Index |
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