Structural and compositional study of Erbium-doped silicon nanocrystals by HAADF, EELS and HRTEM techniques in an aberration corrected STEM.

Autor:	Kashtiban, R J, Bangert, U, Crowe, I, Halsall, M P, Sherliker, B, Harvey, A J, Eccles, J, Knights, A P, Gwilliam, R, Gass, M
Zdroj:	Journal of Physics: Conference Series; 2010, Vol. 209 Issue 1, p012043-012046, 4p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu