Fabrication of Planar and Cross-Sectional TEM Specimens Using a Focused Ion Beam.

Autor: Young, R. J., Kirk, E. C. G., Williams, D. A., Ahmed, H.
Zdroj: MRS Online Proceedings Library; 01/20/1990, Vol. 199, pN.PAG-1, 1p
Databáze: Complementary Index
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