Measurements of 1/f Noise in A-Si:H Pin Diodes and Thin-Film-Transistors.

Autor:	Cho, Gyuseong, Drewery, J. S., Fujieda, I., Jing, T., Kaplan, S. N., Perez-Mendez, V., Qureshi, S., Wildermuth, D., Street, R. A.
Zdroj:	MRS Online Proceedings Library; 01/13/1990, Vol. 192, pN.PAG-1, 1p
Databáze:	Complementary Index
Externí odkaz:	Zobrazit plný text záznamu Full text from SpringerLink