Two critical thicknesses in the preferred orientation of TiN thin film.
| Autor: | Oh, U. C., Je, Jung Ho, Lee, Jeong Y. |
|---|---|
| Zdroj: | Journal of Materials Research; 05/01/1998, Vol. 13 Issue 5, p1225-1229, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
| Autor: | Oh, U. C., Je, Jung Ho, Lee, Jeong Y. |
|---|---|
| Zdroj: | Journal of Materials Research; 05/01/1998, Vol. 13 Issue 5, p1225-1229, 5p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
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