Comparative measurement of residual stress in diamond coatings by low-incident-beam-angle-diffraction and micro-Raman spectroscopy.
Autor: | Mohrbacher, H., Acker, K. Van, Blanpain, B., Houtte, P. Van, Celis, J-P. |
---|---|
Zdroj: | Journal of Materials Research; 07/01/1996, Vol. 11 Issue 7, p1776-1782, 7p |
Databáze: | Complementary Index |
Externí odkaz: |