Microstructural characterization of ordered nickel silicide structures grown on (111) nickel silicide films.

Autor: Ho, Herbert L., Bauer, Charles L., Mahajan, Subhash, Laughlin, David E., Milnes, Arthur G.
Zdroj: Journal of Materials Research; 04/01/1996, Vol. 11 Issue 4, p904-911, 8p
Databáze: Complementary Index