X-ray depth profiling of iron oxide thin films.
| Autor: | Toney, Michael F., Huang, Ting C., Brennan, Sean, Rek, Zophia |
|---|---|
| Zdroj: | Journal of Materials Research; 04/01/1988, Vol. 3 Issue 2, p351-356, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Toney, Michael F., Huang, Ting C., Brennan, Sean, Rek, Zophia |
|---|---|
| Zdroj: | Journal of Materials Research; 04/01/1988, Vol. 3 Issue 2, p351-356, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|
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