| Autor: |
Habiby, Payam, Asli, Rahebeh Niaraki |
| Zdroj: |
16th CSI International Symposium on Computer Architecture & Digital Systems (CADS 2012); 1/ 1/2012, p99-103, 5p |
| Abstrakt: |
With the advance of VLSI technology and growth of embedded memory density, a corresponding increase in the number of defects has resulted in yield and quality degradation. Built-in Self-Repair (BISR) solves this problem by replacing faulty cells with healthy redundant cells. Built-in Redundancy analyzer (BIRA) as a key component of BISR performs redundancy analysis and spare allocation. In this paper we used the symmetry feature of binary search tree to reduce the BIRA hardware overhead. Implementation results of the proposed BIRA for a 2×2 redundancy configuration are presented. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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