| Autor: |
Duvvury, Charvaka, Dobson, Joel, Gauthier, Robert, Grund, Evan, Carn, Brett, Stadler, Wolfgang, Miller, James, Welsher, Terry, Gaertner, Reinhold, Ward, Scott, Chaine, Mike, Righter, Alan |
| Zdroj: |
Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012; 1/ 1/2012, p1-9, 9p |
| Abstrakt: |
The concept of selecting a reduced sample of identical pins for reducing the HBM ESD test times is introduced. It is shown that when the reduced sample has a tight failure distribution above an HBM specification level, the sampling approach can be accurate and will save HBM ESD test time. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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