| Autor: |
Cochran, Donna J., Boutte, Alvin J., Chen, Dakai, Pellish, Jonathan A., Ladbury, Raymond L., Casey, Megan C., Campola, Michael J., Wilcox, Edward P., O'Bryan, Martha V., LaBel, Kenneth A., Lauenstein, Jean-Marie, Batchelor, David A., Oldham, Timothy R. |
| Zdroj: |
2012 IEEE Radiation Effects Data Workshop; 1/ 1/2012, p1-9, 9p |
| Abstrakt: |
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear, and hybrid devices. [ABSTRACT FROM PUBLISHER] |
| Databáze: |
Complementary Index |
| Externí odkaz: |
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