Equipment and Test Results of the Electronic Components to SEE in the Temperature Range.

Autor: Anashin, Vasily S., Kozyukov, Alexander E., Emeliyanov, Vladimir V., Ozerov, Alexander I., Vatuev, Alexander S., Besetskiy, Alexey V., Skuratov, Vladimir A., Bakerenkov, Alexander S., Belyakov, Vladimir V.
Zdroj: 2012 IEEE Radiation Effects Data Workshop; 1/ 1/2012, p1-5, 5p
Abstrakt: This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and cooling of DUT was considered in vacuum chamber of test facility. [ABSTRACT FROM PUBLISHER]
Databáze: Complementary Index